Diode -(P-n Junction Diode Forward and Reverse Bias)
Semiconductor Electronics Material Devices and Simple Circuits

150863 The reason of current flow in p-n junction in forward bias is

1 drifting of charge carriers
2 drifting of minority charge carriers
3 diffusion of charge carriers
4 All of the above
Semiconductor Electronics Material Devices and Simple Circuits

150866 The I-V characteristics of a p-n junction diode in forward bias is shown in the figure. Ratio of dynamic resistance, corresponding to forward bias voltage of \(2 \mathrm{~V}\) and \(4 \mathrm{~V}\) respective is:
original image

1 \(1: 2\)
2 \(5: 1\)
3 \(1: 40\)
4 \(20: 1\)
Semiconductor Electronics Material Devices and Simple Circuits

150871 In a \(p-n\) junction diode, the thickness of deplection layer is \(2 \times 10^{-6} \mathrm{~m}\) and barrier potential is \(0.3 \mathrm{~V}\). The intensity of the electric field at the junction is

1 \(0.6 \times 10^{-6} \mathrm{Vm}^{-1}\) from \(\mathrm{n}\) to \(\mathrm{p}\) side
2 \(0.6 \times 10^{-6} \mathrm{Vm}^{-1}\) from \(\mathrm{p}\) to \(\mathrm{n}\) side
3 \(1.5 \times 10^5 \mathrm{Vm}^{-1}\) from \(\mathrm{n}\) to \(\mathrm{p}\) side
4 \(1.5 \times 10^5 \mathrm{Vm}^{-1}\) from \(\mathrm{p}\) to \(\mathrm{n}\) side
Semiconductor Electronics Material Devices and Simple Circuits

150872 The output current versus time curve of a rectifier is shown in the figure. The average value of output current in this case is
original image

1 0
2 \(\frac{\mathrm{I}_0}{2}\)
3 \(\frac{2 \mathrm{I}_0}{\pi}\)
4 \(\mathrm{I}_0\)
Semiconductor Electronics Material Devices and Simple Circuits

150863 The reason of current flow in p-n junction in forward bias is

1 drifting of charge carriers
2 drifting of minority charge carriers
3 diffusion of charge carriers
4 All of the above
Semiconductor Electronics Material Devices and Simple Circuits

150866 The I-V characteristics of a p-n junction diode in forward bias is shown in the figure. Ratio of dynamic resistance, corresponding to forward bias voltage of \(2 \mathrm{~V}\) and \(4 \mathrm{~V}\) respective is:
original image

1 \(1: 2\)
2 \(5: 1\)
3 \(1: 40\)
4 \(20: 1\)
Semiconductor Electronics Material Devices and Simple Circuits

150871 In a \(p-n\) junction diode, the thickness of deplection layer is \(2 \times 10^{-6} \mathrm{~m}\) and barrier potential is \(0.3 \mathrm{~V}\). The intensity of the electric field at the junction is

1 \(0.6 \times 10^{-6} \mathrm{Vm}^{-1}\) from \(\mathrm{n}\) to \(\mathrm{p}\) side
2 \(0.6 \times 10^{-6} \mathrm{Vm}^{-1}\) from \(\mathrm{p}\) to \(\mathrm{n}\) side
3 \(1.5 \times 10^5 \mathrm{Vm}^{-1}\) from \(\mathrm{n}\) to \(\mathrm{p}\) side
4 \(1.5 \times 10^5 \mathrm{Vm}^{-1}\) from \(\mathrm{p}\) to \(\mathrm{n}\) side
Semiconductor Electronics Material Devices and Simple Circuits

150872 The output current versus time curve of a rectifier is shown in the figure. The average value of output current in this case is
original image

1 0
2 \(\frac{\mathrm{I}_0}{2}\)
3 \(\frac{2 \mathrm{I}_0}{\pi}\)
4 \(\mathrm{I}_0\)
NEET Test Series from KOTA - 10 Papers In MS WORD WhatsApp Here
Semiconductor Electronics Material Devices and Simple Circuits

150863 The reason of current flow in p-n junction in forward bias is

1 drifting of charge carriers
2 drifting of minority charge carriers
3 diffusion of charge carriers
4 All of the above
Semiconductor Electronics Material Devices and Simple Circuits

150866 The I-V characteristics of a p-n junction diode in forward bias is shown in the figure. Ratio of dynamic resistance, corresponding to forward bias voltage of \(2 \mathrm{~V}\) and \(4 \mathrm{~V}\) respective is:
original image

1 \(1: 2\)
2 \(5: 1\)
3 \(1: 40\)
4 \(20: 1\)
Semiconductor Electronics Material Devices and Simple Circuits

150871 In a \(p-n\) junction diode, the thickness of deplection layer is \(2 \times 10^{-6} \mathrm{~m}\) and barrier potential is \(0.3 \mathrm{~V}\). The intensity of the electric field at the junction is

1 \(0.6 \times 10^{-6} \mathrm{Vm}^{-1}\) from \(\mathrm{n}\) to \(\mathrm{p}\) side
2 \(0.6 \times 10^{-6} \mathrm{Vm}^{-1}\) from \(\mathrm{p}\) to \(\mathrm{n}\) side
3 \(1.5 \times 10^5 \mathrm{Vm}^{-1}\) from \(\mathrm{n}\) to \(\mathrm{p}\) side
4 \(1.5 \times 10^5 \mathrm{Vm}^{-1}\) from \(\mathrm{p}\) to \(\mathrm{n}\) side
Semiconductor Electronics Material Devices and Simple Circuits

150872 The output current versus time curve of a rectifier is shown in the figure. The average value of output current in this case is
original image

1 0
2 \(\frac{\mathrm{I}_0}{2}\)
3 \(\frac{2 \mathrm{I}_0}{\pi}\)
4 \(\mathrm{I}_0\)
Semiconductor Electronics Material Devices and Simple Circuits

150863 The reason of current flow in p-n junction in forward bias is

1 drifting of charge carriers
2 drifting of minority charge carriers
3 diffusion of charge carriers
4 All of the above
Semiconductor Electronics Material Devices and Simple Circuits

150866 The I-V characteristics of a p-n junction diode in forward bias is shown in the figure. Ratio of dynamic resistance, corresponding to forward bias voltage of \(2 \mathrm{~V}\) and \(4 \mathrm{~V}\) respective is:
original image

1 \(1: 2\)
2 \(5: 1\)
3 \(1: 40\)
4 \(20: 1\)
Semiconductor Electronics Material Devices and Simple Circuits

150871 In a \(p-n\) junction diode, the thickness of deplection layer is \(2 \times 10^{-6} \mathrm{~m}\) and barrier potential is \(0.3 \mathrm{~V}\). The intensity of the electric field at the junction is

1 \(0.6 \times 10^{-6} \mathrm{Vm}^{-1}\) from \(\mathrm{n}\) to \(\mathrm{p}\) side
2 \(0.6 \times 10^{-6} \mathrm{Vm}^{-1}\) from \(\mathrm{p}\) to \(\mathrm{n}\) side
3 \(1.5 \times 10^5 \mathrm{Vm}^{-1}\) from \(\mathrm{n}\) to \(\mathrm{p}\) side
4 \(1.5 \times 10^5 \mathrm{Vm}^{-1}\) from \(\mathrm{p}\) to \(\mathrm{n}\) side
Semiconductor Electronics Material Devices and Simple Circuits

150872 The output current versus time curve of a rectifier is shown in the figure. The average value of output current in this case is
original image

1 0
2 \(\frac{\mathrm{I}_0}{2}\)
3 \(\frac{2 \mathrm{I}_0}{\pi}\)
4 \(\mathrm{I}_0\)